NI PXIe-1082 8-Slot Hybrid PXI Express Chassis with High-Speed Backplane & Built-in Synchronization Clock

Product Description

PXIe-1082 is an 8-slot PXI Express test chassis developed by National Instruments, fully compliant with PXI-5 hardware specification, manufactured in USA for high-performance data acquisition, 

aerospace testing, industrial measurement and automated validation systems.

This chassis adopts a hybrid slot layout: 1 system controller slot, 3 dedicated PXIe slots, 4 universal hybrid slots and 1 independent system timing slot. Hybrid slots support both legacy 

PXI modules and new PXIe/CPCIe modules, enabling seamless upgrade of existing test systems without full hardware replacement.

The backplane delivers up to 8 GB/s total system bandwidth, with 2 GB/s unidirectional dedicated x4 PCIe bandwidth per slot to support high-speed DAQ, high-frequency digitizer and signal 

generation modules. It integrates complete PXI synchronization hardware including internal 10 MHz PXI_CLK10 and 100 MHz PXIe_SYNC100 reference clocks, PXI star trigger and differential 

PXIe trigger bus for multi-module synchronous sampling.

Equipped with PWM variable-speed cooling fans with auto temperature adjustment, dual fan modes (AUTO/HIGH) balance low noise and heat dissipation. Built-in temperature monitoring and 

over-temperature alarm circuit protect internal modules from overheating. Standard bench-top metal housing, conformal coated backplane PCB, widely used as replacement spare for automotive 

test benches, semiconductor inspection equipment and military measurement platforms.

Technical Specifications

Model: PXIe-1082, Brand: National Instruments (NI), Origin: USA

Total Slots: 8 slots (1 system slot, 3 PXIe slots, 4 hybrid slots, 1 timing slot)

Backplane Bandwidth: Max total 8 GB/s; 2 GB/s single direction per x4 PCIe slot

Slot Power Capacity: 38 W maximum cooling power per peripheral slot

Supported Modules: PXI, PXI Express, CompactPCI, CompactPCI Express 3U modules

Synchronization Resources

Internal 10 MHz reference clock, ±25 ppm stability, <5 ps jitter

Internal 100 MHz PXIe_SYNC100 clock

PXI trigger bus, PXI star trigger, differential PXIe star trigger

Cooling System: Dual PWM variable-speed fans, AUTO/HIGH switchable fan speed

Acoustic Noise: Min 43.6 dBA under AUTO fan mode (0–30℃ ambient)

Power Supply: Built-in AC power supply

Temperature Monitoring: Multi-point internal thermistors, over-temperature alarm output

Operating Temperature: 0℃ ~ +55℃ full load

Storage Temperature: -20℃ ~ +70℃

Humidity: 5%–95% non-condensing, conformal coated backplane PCB

Protection Class: IP20 bench-top cabinet installation only

Net Weight: Approx. 5.2 kg

Mechanical Standard: Compliant with IEEE 1101.10 3U mechanical specification

Certifications: CE, UL industrial test compliance

Key Features

8-slot hybrid architecture compatible with PXI and PXIe modules, flexible for new test system construction and legacy equipment retrofitting.

High-bandwidth x4 PCIe backplane supports multi-channel high-speed synchronous data acquisition and high-frequency signal generation.

Complete built-in low-jitter clock and trigger resources to realize precise multi-module synchronous measurement without external timing hardware.

Variable-speed PWM fan design, low noise operation under normal temperature and enhanced cooling for high-power module full-load operation.

Real-time internal temperature monitoring with over-temperature fault alarm to avoid module damage caused by poor heat dissipation.

Standard bench-top metal housing with stable mechanical structure, anti-vibration design suitable for laboratory and production test environments.

Full PXI-5 standard compliance, perfectly matched with all NI PXIe DAQ, digitizer, motion and communication modules.

Rugged conformal coated backplane PCB, stable 24/7 continuous long-term operation for automated industrial measurement systems.